ASIC Testing

ASIC Testing

Comport Data offers pre-production runs up to high volume testing for each ASIC design project, including wafer and package verification using in-house wafer probers and handlers. We can also migrate or develop new test programs for existing products.

In-House Characterization and Production Testing Equipment


  • Testers: Mixed signal custom-made testers, designed and built for interfacing to Wafer probers and SMD & DIL handlers.
  • Wafer Probers: Electroglass 6" & 8" wafers with hot chuck system and inker.
  • Handlers: Multi-sites Exatron handlers for testing of most popular packages.
  • Temperature Testing: TestEquity temperature chamber programmable for fast-cycling full military range temperature testing.
  • Analytical Probers: Wentworth Labs probing station with Bausch & Lomb Micro-zoom microscope.
  • Baking equipment for moisture removal per JEDEC J-STD-033.
  • Miscellaneous: Electrical fault detection using Liquid Crystal thermal analysis.


External resources used for failure analysis


  • Focused Ion Beam (FIB) system for modifying and analyzing multi-layered IC structures.
  • Electrostatic Discharge verification (ESD).
  • Photon emission microscopy (PEM) for latchup detection.