Designers of high performance Analog Digital ASICs.




Comport Data Inc. provides complete turnkey ASIC design solutions for analog, digital and mixed-signal ASICs.




Designers of high performance Analog ASICs, Digital ASICs and Mixed-Signal ASICs.              See our projects >>>

  • CT-Scan Front-End IC
  • AC/DC Power Supply Controller
  • Inductive Step-Down Converter
  • Telephony IC
  • Medical Data Acquisition ASIC
  • Photon Counter / Integrator
  • Level Detector IC
  • Stud/Metal/AC Detector IC
  • Low Power Touch Screen ASIC
  • Capacitive Touch Screen ASIC
  • Capacitive Sensor Frontend ASIC
  • Touch Screen Front-End IC
  • Optoelectronics LED Drivers
  • High Speed Bidirectional FIFO
  • CMOS Parallel-To-Serial FIFO
  • CT-Scan Readout IC
  • Readout IC
  • Linear & Rotary Encoder
  • Phase Shift Encoder ASIC
  • MEMS Controller
  • High Voltage Interface ASIC
  • Density/AC Detector
  • HV Power Converter
  • Rectifier Bridge IC
  • Optical Receiver ASIC
  • Opto Encoder


Comport Data is a fabless turn-key microelectronics design company with extensive experience on CMOS design and BiCMOS design for Digital ASIC, Analog ASIC and Mixed Signal ASIC applications, able to undertake the most challenging microelectronics projects.


Our knowledgeable team uses advanced tools for design, simulation and layout of most complex ASIC projects from concept through product development and testing. The team supports a wide range of ASIC requirements including high-speed signal performance, low-voltage, low-power, and low-noise for commercial, industrial, military and space grade applications. This is combined with a unique expertise in high voltage, high temperature and radiation hardened analog ASIC design. Prototype testing and characterization is performed to ensure that the ASIC will meet the reliability goals taking into account factors such as power dissipation and ambient temperature and humidity.


Comport Data also offers volume Mixed Signal testing for each ASIC project, including wafer and package verification using in-house wafer probers and handlers.