{"id":2307,"date":"2016-04-29T17:02:35","date_gmt":"2016-04-29T21:02:35","guid":{"rendered":"https:\/\/www.comport-data.com\/fr\/?page_id=2307"},"modified":"2026-03-05T01:03:14","modified_gmt":"2026-03-05T06:03:14","slug":"tests-asic","status":"publish","type":"page","link":"https:\/\/www.comport-data.com\/fr\/tests-asic\/","title":{"rendered":"Tests ASIC"},"content":{"rendered":"<h2>Tests ASIC<\/h2>\n<h5>Caract\u00e9risation \u00e0 l\u2019interne et \u00e9quipement de v\u00e9rification<\/h5>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"alignright size-full wp-image-2156\" src=\"https:\/\/www.comport-data.com\/wp-content\/uploads\/2016\/03\/asic-testing-1.png\" alt=\"asic-testing-1\" width=\"270\" height=\"361\" srcset=\"https:\/\/www.comport-data.com\/wp-content\/uploads\/2016\/03\/asic-testing-1.png 270w, https:\/\/www.comport-data.com\/wp-content\/uploads\/2016\/03\/asic-testing-1-224x300.png 224w\" sizes=\"auto, (max-width: 270px) 100vw, 270px\" \/><\/p>\n<ul>\n<li>\u00c9quipement de v\u00e9rification : appareils de v\u00e9rification pour signaux mixtes faits sur mesure, con\u00e7us et fabriqu\u00e9s pour faire l\u2019interface avec la machine de test des gaufres, le manipulateur de composantes pour montage en surface et le manipulateur de bo\u00eetier \u00e0 double rang\u00e9e de connexions.<\/li>\n<li>Machine de test des gaufres : \u00e9quipement Electroglass pour des gaufres de 6 et 8 pouces avec un support individuel de gaufre chauffant et syst\u00e8me d\u2019encrage.<\/li>\n<li>Robot manipulateur : manipulateur Exatron pour la v\u00e9rification de composantes des formats de bo\u00eetier les plus populaires.<\/li>\n<li>V\u00e9rification en temp\u00e9rature : chambre thermique TestEquity pouvant \u00eatre programm\u00e9 pour les cycles rapides et pour la v\u00e9rification de la plage de temp\u00e9rature militaire.<\/li>\n<li>\u00c9quipement analytique : station de test Wentworth avec microscope Baush &amp; Lomb Microzoom.<\/li>\n<li>\u00c9quipement d\u2019\u00e9tuvage pour enlever l\u2019humidit\u00e9.<\/li>\n<li>Divers : d\u00e9tection de d\u00e9faut d\u2019origine \u00e9lectrique utilisant les cristaux liquides pour l\u2019analyse thermique.<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h5>Ressources externes utilis\u00e9es pour l\u2019analyse de d\u00e9faillance<\/h5>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"alignright size-full wp-image-2159\" src=\"https:\/\/www.comport-data.com\/wp-content\/uploads\/2016\/03\/asic-testing-2.png\" alt=\"asic-testing-2\" width=\"270\" height=\"343\" srcset=\"https:\/\/www.comport-data.com\/wp-content\/uploads\/2016\/03\/asic-testing-2.png 270w, https:\/\/www.comport-data.com\/wp-content\/uploads\/2016\/03\/asic-testing-2-236x300.png 236w\" sizes=\"auto, (max-width: 270px) 100vw, 270px\" \/><\/p>\n<ul>\n<li><span dir=\"LTR\">Syst\u00e8me FIB pour modifier et analyser les circuits int\u00e9gr\u00e9s \u00e0 multicouche.<\/span><\/li>\n<li><span dir=\"LTR\">D\u00e9charge \u00e9lectrostatique (DES).<\/span><\/li>\n<li><span dir=\"LTR\">Microscopie de photo\u00e9mission d\u2019\u00e9lectrons pour la d\u00e9tection de d\u00e9clenchement parasite.<\/span><\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Tests ASIC Caract\u00e9risation \u00e0 l\u2019interne et \u00e9quipement de v\u00e9rification \u00c9quipement de v\u00e9rification : appareils de v\u00e9rification pour signaux mixtes faits sur mesure, con\u00e7us et fabriqu\u00e9s pour faire l\u2019interface avec la machine de test des gaufres, le manipulateur de composantes pour montage en surface et le manipulateur de bo\u00eetier \u00e0 double rang\u00e9e de connexions. Machine de test des gaufres : \u00e9quipement&nbsp;<a href=\"https:\/\/www.comport-data.com\/fr\/tests-asic\/\" class=\"read-more\">Lire la suite<\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":3,"comment_status":"closed","ping_status":"closed","template":"page-fullwidth.php","meta":{"footnotes":""},"class_list":["post-2307","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Services de tests ASIC &amp; CMOS | V\u00e9rification wafers et bo\u00eetiers<\/title>\n<meta name=\"description\" content=\"Comport Data offre des services de tests ASIC allant des pr\u00e9s\u00e9ries aux grands volumes, incluant la v\u00e9rification sur wafer et bo\u00eetier, ainsi que la migration et le d\u00e9veloppement de programmes de test pour circuits int\u00e9gr\u00e9s mixtes.\" \/>\n<meta name=\"robots\" content=\"index, follow, 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