{"version":"1.0","provider_name":"Comport Data","provider_url":"https:\/\/www.comport-data.com\/fr\/","author_name":"admcmpdt83","author_url":"https:\/\/www.comport-data.com\/fr\/author\/admcmpdt83\/","title":"Services de tests ASIC & CMOS | V\u00e9rification wafers et bo\u00eetiers","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"hUENnMou0t\"><a href=\"https:\/\/www.comport-data.com\/fr\/tests-asic\/\">Tests ASIC<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.comport-data.com\/fr\/tests-asic\/embed\/#?secret=hUENnMou0t\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Tests ASIC\u00a0\u00bb &#8212; Comport Data\" data-secret=\"hUENnMou0t\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/\/# sourceURL=https:\/\/www.comport-data.com\/wp-includes\/js\/wp-embed.min.js\n\/* ]]> *\/\n<\/script>\n","description":"Comport Data offre des services de tests ASIC allant des pr\u00e9s\u00e9ries aux grands volumes, incluant la v\u00e9rification sur wafer et bo\u00eetier, ainsi que la migration et le d\u00e9veloppement de programmes de test pour circuits int\u00e9gr\u00e9s mixtes.","thumbnail_url":"https:\/\/www.comport-data.com\/wp-content\/uploads\/2016\/03\/asic-testing-1.png","thumbnail_width":270,"thumbnail_height":361}