In-House Testing and Characterization Equipment

▪        Testers: Mixed signal custom-made testers, designed and built for interfacing to Wafer probers and SMD & DIL handlers.

▪        Wafer Probers: Electroglass 6" & 8" wafers with hot chuck system and inker.

▪        Handlers: Multi-sites Exatron handlers for testing of most popular packages.

▪        Temperature Testing: TestEquity temperature chamber programmable for fast-cycling full military range temperature testing.

▪        Analytical Probers: Wentworth Labs probing station with Bausch & Lomb Micro-zoom microscope, LeCroy & Tektronix oscilloscopes, Fluke scope-meter, HP & Link Instruments logic analyzers, BK Precision signal generator, Hewlett Packard spectrum analyzer and Agilent programmable power supplies.

▪        Baking equipment for moisture removal per JEDEC J-STD-033.

▪        Miscellaneous: Electrical fault isolation using Liquid Crystal thermal analysis.

External resources used for failure analysis:

▪        Focused Ion Beam (FIB) system for modifying and analyzing multi-layered IC structures

▪        Electrostatic Discharge verification (ESD)

▪        Photon emission microscopy (PEM) for latchup detection.