Designers of high performance Analog Digital ASICs.
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ASIC testing and CMOS testing

 

In-House Characterization and Production Testing Equipment: Wafer probers

  • Testers: Mixed signal custom-made testers, designed and built for interfacing to Wafer probers and SMD & DIL handlers.
  • Wafer Probers: Electroglass 6" & 8" wafers with hot chuck system and inker.
  • Handlers: Multi-sites Exatron handlers for testing of most popular packages.
  • Temperature Testing: TestEquity temperature chamber programmable for fast-cycling full military range temperature testing.
  • Analytical Probers: Wentworth Labs probing station with Bausch & Lomb Micro-zoom microscope.
  • Baking equipment for moisture removal per JEDEC J-STD-033.
  • Miscellaneous: Electrical fault detection using Liquid Crystal thermal analysis.

 

External resources used for failure analysis:

Pick and place handlers

  • Focused Ion Beam (FIB) system for modifying and analyzing multi-layered IC structures
  • Electrostatic Discharge verification (ESD)
  • Photon emission microscopy (PEM) for latchup detection.